reflectometry/refl1d

Refl1D is a program for analyzing 1-D reflectometry measurements made with X-ray and neutron beamlines. It models the depth profile of material scattering density, supporting both structural and magnetic scattering densities, and includes specialized layer types for various applications. This tool is designed for scientists and researchers in fields such as materials science, physics, and chemistry who need to study sub-surface structures of samples using reflectometry data.